年度 2011
全部作者 苏朝琴
论文名称 K. SM. Li, C.L. Lee, C.C. Su, and J.E. Chen, “A Unified Approach to Detecting Crosstalk
Faults of Interconnected in Deep Submicron VLSI,”Proc. 2004 IEEE Asian Test Symposium,
pp. 145-150.
发表日期 2011-07-20