年度	2019
全部作者	洪浩乔
论文名称	H.-C. Hong and L.-Y. Lin, "Accurate and Fast On-Wafer Test Circuitry for Device Array Characterization in Wafer Acceptance Test," presented in IEEE International Symposium on Integrated Circuits and Systems (ISICAS), Venice, Italy, Aug., 2019
发表日期	2019-08-15
语言	中文