年度 2011
全部作者 苏朝琴
论文名称

Chih-Wen Lu; Chung Len Lee; Chen, J.E.; Chauchin Su; "A new IDDQ testing scheme
employing charge storage BICS circuit for deep submicron CMOS ULSI," Proc. 1998
International Workshop on IDDQ Testing, November 1998, pp. 54 -58.

发表日期 2011-07-20