Year 2012
Authors Hao-Chiao Hong
Paper Title Long-Yi Lin, Shao-Feng Hung, and Hao-Chiao Hong, “A Test Procedure to Test for the Capacitor Ratios of a Switched-Capacitor Biquad,” n the 6th VLSI Test Technology Workshop (VTTW), July, 2012
Date of Publication 2013-11-15
Language Chinese