Year 2011
Authors Chiu, Yi
Paper Title “Characterization of a burn-in failure caused by a defective source driver on TFT-LCD panel,” FSC Wang, K-L. Lin, K-Y. Tso, C-C. Chao, WW Wang, A. Yu, C-Y. Lee, C-H. Kuo, CWA Wang, Y. Chiu, 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits, Singapore, 171-4 (2006).
Date of Publication 2011-07-26